Relative detection efficiency of back- and front-illuminated charge-coupled device cameras for x-rays between 1  keV and 18  keV

Szlachetko, Jakub; Dousse, Jean-Claude; Hoszowska, Joanna; Berset, Michel; Cao, Wei; Szlachetko, Monika; Kavčič, Matjaz

doi:10.1063/1.2779214

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Journal article

Relative detection efficiency of back- and front-illuminated charge-coupled device cameras for x-rays between 1 keV and 18 keV

Szlachetko, Jakub Department of Physics, University of Fribourg, Switzerland
Dousse, Jean-Claude Department of Physics, University of Fribourg, Switzerland
Hoszowska, Joanna Department of Physics, University of Fribourg, Switzerland
Berset, Michel Department of Physics, University of Fribourg, Switzerland
Cao, Wei Department of Physics, University of Fribourg, Switzerland
Szlachetko, Monika Department of Physics, University of Fribourg, Switzerland
Kavčič, Matjaz J. Stefan Institute, Ljubljana, Slovenia

17.09.2007

Published in:

Review of Scientific Instruments. - 2007, vol. 78, no. 9, p. 093102

English High-resolution x-ray measurements were performed with a von Hamos-type bent crystal spectrometer using for the detection of the diffracted photons either a back- illuminated charge-coupled device (CCD) camera or a front-illuminated one. For each CCD the main x-ray emission lines (e.g., Kα, Kβ, Lα, and Lβ) of a variety of elements were measured in order to probe the performances of the two detectors between 1 and 18 keV. From the observed x-ray lines the linearity of the energy response, the noise level, the energy resolution, and the quantum efficiency ratio of the two CCDs were determined.

Faculty

Faculté des sciences et de médecine

Department

Département de Physique

Language