Szlachetko, Jakub Dousse, Jean-Claude Hoszowska, Joanna Berset, Michel Cao, Wei Szlachetko, Monika Kavčič, Matjaz 2007-09-17 High-resolution x-ray measurements were performed with a von Hamos-type bent crystal spectrometer using for the detection of the diffracted photons either a back- illuminated charge-coupled device (CCD) camera or a front-illuminated one. For each CCD the main x-ray emission lines (e.g., <i>K</i>α, <i>K</i>β, <i>L</i>α, and <i>L</i>β) of a variety of elements were measured in order to probe the performances of the two detectors between 1 and 18 keV. From the observed x-ray lines the linearity of the energy response, the noise level, the energy resolution, and the quantum efficiency ratio of the two CCDs were determined. application/pdf https://folia.unifr.ch/global/documents/300628 https://folia.unifr.ch/documents/300628/files/dousse_rde.pdf eng info:eu-repo/semantics/altIdentifier/doi/10.1063/1.2779214 info:eu-repo/semantics/openAccess License undefined Review of Scientific Instruments. - 2007, vol. 78, no. 9, p. 093102 info:eu-repo/classification/udc/53 Relative detection efficiency of back- and front-illuminated charge-coupled device cameras for x-rays between 1 keV and 18 keV http://purl.org/coar/resource_type/c_6501