Journal article

High-resolution XES and RIXS studies with a von Hamos Bragg crystal spectrometer

    20.03.2004
Published in:
  • Journal of Electron Spectroscopy and Related Phenomena. - 2004, vol. 137-140, p. 687-690
English The high-resolution von Hamos Bragg crystal spectrometer was constructed for the study of K X-ray emission from low-Z elements and L and M X-ray spectra of medium to high Z elements. Recently, this instrument was applied to high-resolution XES and RIXS studies using X-ray synchrotron radiation at the ID21 and BM5 beamlines at the ESRF. An outline of the spectrometer design and performance characteristics will be given. The studies deal with the energy dependent KL double photoexcitation of argon, the L3 and M1 atomic-level widths of elements 54≤Z≤77, and the evolution of the K-edge RIXS spectra of manganese oxides.
Faculty
Faculté des sciences et de médecine
Department
Département de Physique
Language
  • English
Classification
Physics
License
License undefined
Identifiers
Persistent URL
https://folia.unifr.ch/unifr/documents/299743
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