High-resolution XES and RIXS studies with a von Hamos Bragg crystal spectrometer
Published in:
- Journal of Electron Spectroscopy and Related Phenomena. - 2004, vol. 137-140, p. 687-690
English
The high-resolution von Hamos Bragg crystal spectrometer was constructed for the study of K X-ray emission from low-Z elements and L and M X-ray spectra of medium to high Z elements. Recently, this instrument was applied to high-resolution XES and RIXS studies using X-ray synchrotron radiation at the ID21 and BM5 beamlines at the ESRF. An outline of the spectrometer design and performance characteristics will be given. The studies deal with the energy dependent KL double photoexcitation of argon, the L3 and M1 atomic-level widths of elements 54≤Z≤77, and the evolution of the K-edge RIXS spectra of manganese oxides.
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Faculty
- Faculté des sciences et de médecine
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Department
- Département de Physique
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Language
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Classification
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Physics
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License
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License undefined
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Identifiers
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Persistent URL
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https://folia.unifr.ch/unifr/documents/299743
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