Journal article

Long-lived transient anion of c-C₄F₈O

  • Kočišek, J. J. Heyrovský Institute of Physical Chemistry, Czech Academy of Sciences, Prague, Czech Republic
  • Janečková, Radmila Department of Chemistry, University of Fribourg, Switzerland
  • Fedor, Juraj J. Heyrovský Institute of Physical Chemistry, Czech Academy of Sciences, Prague, Czech Republic
    16.02.2018
Published in:
  • The Journal of Chemical Physics. - 2018, vol. 148, no. 7, p. 074303
English We report partial cross sections for electron attachment to c-C4F8O, a gas with promising technological applications in free-electron-rich environments. The dissociative electron attachment leads to a number of anionic fragments resulting from complex bond-breaking and bond-forming processes. However, the anion with the highest abundance is the non-dissociated (transient) parent anion which is formed around 0.9 eV electron energy. Its lifetime reaches tens of microseconds. We discuss the origin of this long lifetime, the anion’s strong interactions with other molecules, and the consequences for electron-scavenging properties of c-C4F8O in denser environments, in particular for its use in mixtures with CO2 and N2
Faculty
Faculté des sciences et de médecine
Department
Département de Chimie
Language
  • English
Classification
Chemistry
License
License undefined
Identifiers
Persistent URL
https://folia.unifr.ch/unifr/documents/307049
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