Pinar, A. B.Paul Scherrer Institut (PSI), 5232 Villigen PSI, Switzerland
Bokhoven, Jeroen A. vanPaul Scherrer Institut (PSI), 5232 Villigen PSI, Switzerland - Department of Chemistry and Applied Biosciences, ETH Zürich, Switzerland
Physical Chemistry Chemical Physics. - 2017, vol. 19, no. 43, p. 29271–29277
English
The potential of valence to core Al X-ray emission spectroscopy to determine aluminum distribution in ferrierite zeolites was investigated. The recorded emission spectra of four samples prepared with different structure directing agents exhibit slight variations in the position of the main emission peak and the intensity of its low energy shoulder. Theoretical calculations indicate that an increased intensity of the Kβx shoulder in the Al emission spectra can be linked to a predominant occupation of the T3 site by a single aluminum atom. This study thus suggests that valence to core X- ray emission spectroscopy can be applied to help determine the occupation of aluminum at crystallographic T-sites in zeolites.