Layer-resolved study of Mg atom incorporation at the MgO/Ag(001) buried interface
- Jaouen, Thomas Département de Physique and Fribourg Center for Nanomaterials, Université de Fribourg, Switzerland - Département Matériaux Nanosciences, Institut de Physique, Université de Rennes, France
- Tricot, S. Département Matériaux Nanosciences, Institut de Physique, Université de Rennes, France
- Delhaye, G. Département Matériaux Nanosciences, Institut de Physique, Université de Rennes, France
- Lépine, B. Département Matériaux Nanosciences, Institut de Physique, Université de Rennes, France
- Sébilleau, D. Département Matériaux Nanosciences, Institut de Physique, Université de Rennes, France
- Jézéquel, G. Département Matériaux Nanosciences, Institut de Physique, Université de Rennes, France
- Schieffer, Philippe Département Matériaux Nanosciences, Institut de Physique, Université de Rennes, France
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11.07.2013
Published in:
- Physical Review Letters. - 2013, vol. 111, no. 2, p. 027601
English
By combining x-ray excited Auger electron diffraction experiments and multiple scattering calculations we reveal a layer-resolved shift for the Mg KL₂₃L₂₃ Auger transition in MgO ultrathin films (4–6 Å) on Ag(001). This resolution is exploited to demonstrate the possibility of controlling Mg atom incorporation at the MgO/Ag(001) interface by exposing the MgO films to a Mg flux. A substantial reduction of the MgO/Ag(001) work function is observed during the exposition phase and reflects both band-offset variations at the interface and band bending effects in the oxide film.
- Faculty
- Faculté des sciences et de médecine
- Department
- Département de Physique
- Language
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- English
- Classification
- Physics
- License
- License undefined
- Identifiers
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- RERO DOC 136727
- DOI 10.1103/PhysRevLett.111.027601
- Persistent URL
- https://folia.unifr.ch/unifr/documents/303169
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