Journal article

Layer-resolved study of Mg atom incorporation at the MgO/Ag(001) buried interface

  • Jaouen, Thomas Département de Physique and Fribourg Center for Nanomaterials, Université de Fribourg, Switzerland - Département Matériaux Nanosciences, Institut de Physique, Université de Rennes, France
  • Tricot, S. Département Matériaux Nanosciences, Institut de Physique, Université de Rennes, France
  • Delhaye, G. Département Matériaux Nanosciences, Institut de Physique, Université de Rennes, France
  • Lépine, B. Département Matériaux Nanosciences, Institut de Physique, Université de Rennes, France
  • Sébilleau, D. Département Matériaux Nanosciences, Institut de Physique, Université de Rennes, France
  • Jézéquel, G. Département Matériaux Nanosciences, Institut de Physique, Université de Rennes, France
  • Schieffer, Philippe Département Matériaux Nanosciences, Institut de Physique, Université de Rennes, France
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    11.07.2013
Published in:
  • Physical Review Letters. - 2013, vol. 111, no. 2, p. 027601
English By combining x-ray excited Auger electron diffraction experiments and multiple scattering calculations we reveal a layer-resolved shift for the Mg KL₂₃L₂₃ Auger transition in MgO ultrathin films (4–6 Å) on Ag(001). This resolution is exploited to demonstrate the possibility of controlling Mg atom incorporation at the MgO/Ag(001) interface by exposing the MgO films to a Mg flux. A substantial reduction of the MgO/Ag(001) work function is observed during the exposition phase and reflects both band-offset variations at the interface and band bending effects in the oxide film.
Faculty
Faculté des sciences et de médecine
Department
Département de Physique
Language
  • English
Classification
Physics
License
License undefined
Identifiers
Persistent URL
https://folia.unifr.ch/unifr/documents/303169
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