Journal article

A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies

  • Szlachetko, Jakub Paul Scherrer Institut, Villigen PSI, Switzerland - Institute of Physics, Jan Kochanowski University, Kielce, Poland
  • Nachtegaal, M. Paul Scherrer Institut, Villigen PSI, Switzerland
  • Boni, E. de Paul Scherrer Institut, Villigen PSI, Switzerland
  • Willimann, M. Paul Scherrer Institut, Villigen PSI, Switzerland
  • Safonova, O. Paul Scherrer Institut, Villigen PSI, Switzerland
  • Sa, J. Paul Scherrer Institut, Villigen PSI, Switzerland
  • Smolentsev, G. Paul Scherrer Institut, Villigen PSI, Switzerland
  • Szlachetko, Monika Paul Scherrer Institut, Villigen PSI, Switzerland
  • Bokhoven, J. A. van Paul Scherrer Institut, Villigen PSI, Switzerland - Institute for Chemical and Bioengineering, ETH Zurich, Switzerland
  • Dousse, Jean-Claude Department of Physics, University of Fribourg, Switzerland
  • Hoszowska, Joanna Department of Physics, University of Fribourg, Switzerland
  • Kayser, Yves Department of Physics, University of Fribourg, Switzerland
  • Jagodziński, P. University of Technology, Kielce, Poland
  • Bergamaschi, A. Paul Scherrer Institut, Villigen PSI, Switzerland
  • Schmitt, Bernd Paul Scherrer Institut, Villigen PSI, Switzerland
  • David, Christian Paul Scherrer Institut, Villigen PSI, Switzerland
  • Lücke, A. Paul Scherrer Institut, Villigen PSI, Switzerland
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    09.10.2012
Published in:
  • Review of Scientific Instruments. - 2012, vol. 83, no. 10, p. 103105
English We report on the design and performance of a wavelength-dispersive type spectrometer based on the von Hamos geometry. The spectrometer is equipped with a segmented-type crystal for x-ray diffraction and provides an energy resolution in the order of 0.25 eV and 1 eV over an energy range of 8000 eV–9600 eV. The use of a segmented crystal results in a simple and straightforward crystal preparation that allows to preserve the spectrometer resolution and spectrometer efficiency. Application of the spectrometer for time-resolved resonant inelastic x-ray scattering and single-shot x-ray emission spectroscopy is demonstrated.
Faculty
Faculté des sciences et de médecine
Department
Département de Physique
Language
  • English
Classification
Physics
License
License undefined
Identifiers
Persistent URL
https://folia.unifr.ch/unifr/documents/302755
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