A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies

Szlachetko, Jakub; Nachtegaal, M.; Boni, E. de; Willimann, M.; Safonova, O.; Sa, J.; Smolentsev, G.; Szlachetko, Monika; Bokhoven, J. A. van; Dousse, Jean-Claude; Hoszowska, Joanna; Kayser, Yves; Jagodziński, P.; Bergamaschi, A.; Schmitt, Bernd; David, Christian; Lücke, A.

doi:10.1063/1.4756691

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Journal article

A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies

Szlachetko, Jakub Paul Scherrer Institut, Villigen PSI, Switzerland - Institute of Physics, Jan Kochanowski University, Kielce, Poland
Nachtegaal, M. Paul Scherrer Institut, Villigen PSI, Switzerland
Boni, E. de Paul Scherrer Institut, Villigen PSI, Switzerland
Willimann, M. Paul Scherrer Institut, Villigen PSI, Switzerland
Safonova, O. Paul Scherrer Institut, Villigen PSI, Switzerland
Sa, J. Paul Scherrer Institut, Villigen PSI, Switzerland
Smolentsev, G. Paul Scherrer Institut, Villigen PSI, Switzerland
Szlachetko, Monika Paul Scherrer Institut, Villigen PSI, Switzerland
Bokhoven, J. A. van Paul Scherrer Institut, Villigen PSI, Switzerland - Institute for Chemical and Bioengineering, ETH Zurich, Switzerland
Dousse, Jean-Claude Department of Physics, University of Fribourg, Switzerland
Hoszowska, Joanna Department of Physics, University of Fribourg, Switzerland
Kayser, Yves Department of Physics, University of Fribourg, Switzerland
Jagodziński, P. University of Technology, Kielce, Poland
Bergamaschi, A. Paul Scherrer Institut, Villigen PSI, Switzerland
Schmitt, Bernd Paul Scherrer Institut, Villigen PSI, Switzerland
David, Christian Paul Scherrer Institut, Villigen PSI, Switzerland
Lücke, A. Paul Scherrer Institut, Villigen PSI, Switzerland

09.10.2012

Published in:

Review of Scientific Instruments. - 2012, vol. 83, no. 10, p. 103105

English We report on the design and performance of a wavelength-dispersive type spectrometer based on the von Hamos geometry. The spectrometer is equipped with a segmented-type crystal for x-ray diffraction and provides an energy resolution in the order of 0.25 eV and 1 eV over an energy range of 8000 eV–9600 eV. The use of a segmented crystal results in a simple and straightforward crystal preparation that allows to preserve the spectrometer resolution and spectrometer efficiency. Application of the spectrometer for time-resolved resonant inelastic x-ray scattering and single-shot x-ray emission spectroscopy is demonstrated.

Faculty

Faculté des sciences et de médecine

Department

Département de Physique

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