A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies
-
Szlachetko, Jakub
Paul Scherrer Institut, Villigen PSI, Switzerland - Institute of Physics, Jan Kochanowski University, Kielce, Poland
-
Nachtegaal, M.
Paul Scherrer Institut, Villigen PSI, Switzerland
-
Boni, E. de
Paul Scherrer Institut, Villigen PSI, Switzerland
-
Willimann, M.
Paul Scherrer Institut, Villigen PSI, Switzerland
-
Safonova, O.
Paul Scherrer Institut, Villigen PSI, Switzerland
-
Sa, J.
Paul Scherrer Institut, Villigen PSI, Switzerland
-
Smolentsev, G.
Paul Scherrer Institut, Villigen PSI, Switzerland
-
Szlachetko, Monika
Paul Scherrer Institut, Villigen PSI, Switzerland
-
Bokhoven, J. A. van
Paul Scherrer Institut, Villigen PSI, Switzerland - Institute for Chemical and Bioengineering, ETH Zurich, Switzerland
-
Dousse, Jean-Claude
Department of Physics, University of Fribourg, Switzerland
-
Hoszowska, Joanna
Department of Physics, University of Fribourg, Switzerland
-
Kayser, Yves
Department of Physics, University of Fribourg, Switzerland
-
Jagodziński, P.
University of Technology, Kielce, Poland
-
Bergamaschi, A.
Paul Scherrer Institut, Villigen PSI, Switzerland
-
Schmitt, Bernd
Paul Scherrer Institut, Villigen PSI, Switzerland
-
David, Christian
Paul Scherrer Institut, Villigen PSI, Switzerland
-
Lücke, A.
Paul Scherrer Institut, Villigen PSI, Switzerland
Show more…
Published in:
- Review of Scientific Instruments. - 2012, vol. 83, no. 10, p. 103105
English
We report on the design and performance of a wavelength-dispersive type spectrometer based on the von Hamos geometry. The spectrometer is equipped with a segmented-type crystal for x-ray diffraction and provides an energy resolution in the order of 0.25 eV and 1 eV over an energy range of 8000 eV–9600 eV. The use of a segmented crystal results in a simple and straightforward crystal preparation that allows to preserve the spectrometer resolution and spectrometer efficiency. Application of the spectrometer for time-resolved resonant inelastic x-ray scattering and single-shot x-ray emission spectroscopy is demonstrated.
-
Faculty
- Faculté des sciences et de médecine
-
Department
- Département de Physique
-
Language
-
-
Classification
-
Physics
-
License
-
License undefined
-
Identifiers
-
-
Persistent URL
-
https://folia.unifr.ch/unifr/documents/302755
Statistics
Document views: 51
File downloads: