Photon path length distribution in random media from spectral speckle intensity correlations

Rojas, L. F.; Bina, M.; Cerchiari, G.; Escobedo-Sánchez, M. A.; Ferri, F.; Scheffold, Frank

doi:10.1140/epjst/e2011-01512-2

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Journal article

Photon path length distribution in random media from spectral speckle intensity correlations

Rojas, L. F. Departamento de Física, Cinvestav-IPN, México
Bina, M. Dipartimento di Fisica e Matematica, Università degli Studi dell’Insubria, Como, Italy
Cerchiari, G. Dipartimento di Fisica, Università degli studi di Milano, Italy
Escobedo-Sánchez, M. A. Departamento de Física, Cinvestav-IPN, México
Ferri, F. Dipartimento di Fisica e Matematica, Università degli Studi dell’Insubria, Como, Italy
Scheffold, Frank Department of Physics, University of Fribourg, Switzerland

07.12.2011

Published in:

The European Physical Journal - Special Topics. - 2011, vol. 199, no. 1, p. 167-180

English We show that the spectral speckle intensity correlation (SSIC) technique can be profitably exploited to recover the path length distribution of photons scattered in a random turbid medium. We applied SSIC to the study of Teflon slabs of different thicknesses and were able to recover, via the use of the photon diffusion approximation theory, the characteristic transport mean free path ℓ∗ and absorption length s a of the medium. These results were compared and validated by means of complementary measurements performed on the same samples with standard pulsed laser time of flight techniques.

Faculty

Faculté des sciences et de médecine

Department

Département de Physique

Language