Journal article

Wavelength-dispersive spectrometer for X-ray microfluorescence analysis at the X-ray microscopy beamline ID21 (ESRF)

  • Szlachetko, Jakub European Synchrotron Radiation Facility, Grenoble, France - Institute of Physics, Jan Kochanowski, University, Kielce, Poland
  • Cotte, M. European Synchrotron Radiation Facility, Grenoble, France - Centre of Research and Restoration of French Museums, Paris, France
  • Morse, J. European Synchrotron Radiation Facility, Grenoble, France
  • Salomé, M. European Synchrotron Radiation Facility, Grenoble, France
  • Jagodzinski, P. Technology University, Kielce, Poland
  • Dousse, Jean-Claude Department of Physics, University of Fribourg, Switzerland
  • Hoszowska, Joanna Department of Physics, University of Fribourg, Switzerland
  • Kayser, Yves Department of Physics, University of Fribourg, Switzerland
  • Susini, J. European Synchrotron Radiation Facility, Grenoble, France
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    2010
Published in:
  • Journal of Synchrotron Radiation. - 2010, vol. 17, no. 3, p. 400-408
English The development of a wavelength-dispersive spectrometer for microfluorescence analysis at the X-ray Microscopy ID21 beamline of the European Synchrotron Radiation Facility (ESRF) is reported. The spectrometer is based on a polycapillary optic for X-ray fluorescence collection and is operated in a flat-crystal geometry. The design considerations as well as operation characteristics of the spectrometer are presented. The achieved performances, in particular the energy resolution, are compared with the results of Monte Carlo simulations. Further improvement in the energy resolution, down to ~eV range, by employing a double-crystal geometry is examined. Finally, examples of applications requiring both spatial and spectral resolutions are presented.
Faculty
Faculté des sciences et de médecine
Department
Département de Physique
Language
  • English
Classification
Physics
License
License undefined
Identifiers
Persistent URL
https://folia.unifr.ch/unifr/documents/301516
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