Wavelength-dispersive spectrometer for X-ray microfluorescence analysis at the X-ray microscopy beamline ID21 (ESRF)
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Szlachetko, Jakub
European Synchrotron Radiation Facility, Grenoble, France - Institute of Physics, Jan Kochanowski, University, Kielce, Poland
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Cotte, M.
European Synchrotron Radiation Facility, Grenoble, France - Centre of Research and Restoration of French Museums, Paris, France
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Morse, J.
European Synchrotron Radiation Facility, Grenoble, France
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Salomé, M.
European Synchrotron Radiation Facility, Grenoble, France
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Jagodzinski, P.
Technology University, Kielce, Poland
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Dousse, Jean-Claude
Department of Physics, University of Fribourg, Switzerland
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Hoszowska, Joanna
Department of Physics, University of Fribourg, Switzerland
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Kayser, Yves
Department of Physics, University of Fribourg, Switzerland
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Susini, J.
European Synchrotron Radiation Facility, Grenoble, France
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Published in:
- Journal of Synchrotron Radiation. - 2010, vol. 17, no. 3, p. 400-408
English
The development of a wavelength-dispersive spectrometer for microfluorescence analysis at the X-ray Microscopy ID21 beamline of the European Synchrotron Radiation Facility (ESRF) is reported. The spectrometer is based on a polycapillary optic for X-ray fluorescence collection and is operated in a flat-crystal geometry. The design considerations as well as operation characteristics of the spectrometer are presented. The achieved performances, in particular the energy resolution, are compared with the results of Monte Carlo simulations. Further improvement in the energy resolution, down to ~eV range, by employing a double-crystal geometry is examined. Finally, examples of applications requiring both spatial and spectral resolutions are presented.
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Faculty
- Faculté des sciences et de médecine
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Department
- Département de Physique
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Language
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Classification
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Physics
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License
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License undefined
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Identifiers
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Persistent URL
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https://folia.unifr.ch/unifr/documents/301516
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