X-ray reflectivity reveals equilibrium density profile of molecular liquid under nanometre confinement
- Perret, Edith Paul Scherrer Institut, Villigen, Switzerland
- Nygård, K. Paul Scherrer Institut, Villigen, Switzerland
- Satapathy, Dillip Kumar University of Fribourg
- Balmer, T. E. ETH Zürich, Switzerland
- Bunk, O. Paul Scherrer Institut, Villigen, Switzerland
- Heuberger, M. EMPA, St. Gallen, Switzerland
- Veen, J. F. van der Paul Scherrer Institut, Villigen, Switzerland - ETH Zürich, Switzerland
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13.11.2009
Published in:
- Europhysics Letters. - 2009, vol. 88, no. 3, p. 36004
English
A silane (tetrakis(trimethylsiloxy)silane) has been confined within a space of a few molecular diameters (9 Å) between two atomically flat opposing mica membranes. The liquid's electron density profile along the confinement direction has been determined by synchrotron X-ray reflectivity for film thicknesses of 8.58 and 11.22 nm. We find the liquid's molecules to be strongly layered at layer distances significantly larger than the effective molecular diameter. The considerable free volume enables the confined liquid to retain its liquid properties.
- Faculty
- Faculté des sciences et de médecine
- Department
- Département de Physique
- Language
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- English
- Classification
- Physics
- License
- License undefined
- Identifiers
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- RERO DOC 17067
- DOI 10.1209/0295-5075/88/36004
- Persistent URL
- https://folia.unifr.ch/unifr/documents/301454
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