X-ray photoelectron diffraction study of Cu(1 1 1): Multiple scattering investigation
- Despont, L. Institut de Physique, Université de Neuchâtel, Switzerland
- Naumović, Dusanka Institut de Physique, Université de Fribourg, Switzerland
- Clerc, F. Institut de Physique, Université de Neuchâtel, Switzerland
- Koitzsch, C. Institut de Physique, Université de Neuchâtel, Switzerland
- Garnier, Michael G. Institut de Physique, Université de Neuchâtel, Switzerland
- Abajo, F. J. Garcia de Centro Mixto CSIC-UPV/EHU, San Sebastián, Spain
- Hove, M. A. Van Department of Physics and Materials Science, City University of Hong Kong, Kowloon, Hong Kong
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05.12.2005
Published in:
- Surface Science. - 2006, vol. 600, no. 2, p. 380-385
Photoelectron diffraction
multiple scattering
Copper
electron solid interaction
scattering
diffraction
English
Multiple scattering theory based on a cluster model is used to simulate full-hemispherical X-ray photoelectron diffraction measurements in order to verify how state of the art multiple scattering simulations are able to reproduce the experiment. This approach is applied to the Cu(1 1 1) surface for two different photoelectron kinetic energies. Differences and similarities between single and multiple scattering are discussed in comparison with experimental results. We find that the present approach gives very good results despite some limitations.
- Faculty
- Faculté des sciences et de médecine
- Department
- Département de Physique
- Language
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- English
- Classification
- Physics
- License
- License undefined
- Identifiers
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- RERO DOC 7873
- DOI 10.1016/j.susc.2005.10.038
- Persistent URL
- https://folia.unifr.ch/unifr/documents/300166
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