Journal article

Resonant X-ray Raman scattering for Al, Si and their oxides

  • Szlachetko, Jakub Department of Physics, University of Fribourg, Switzerland
  • Berset, Michel Department of Physics, University of Fribourg, Switzerland
  • Dousse, Jean-Claude Department of Physics, University of Fribourg, Switzerland
  • Fennane, Karima Department of Physics, University of Fribourg, Switzerland
  • Szlachetko, Monika Department of Physics, University of Fribourg, Switzerland
  • Barrett, R. European Synchrotron Radiation Facility, Grenoble, France
  • Hoszowska, Joanna European Synchrotron Radiation Facility, Grenoble, France
  • Kubala-Kukus, A. Swietokrzyska Academy, Institute of Physics, Kielce, Poland
  • Pajek, M. Swietokrzyska Academy, Institute of Physics, Kielce, Poland
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    01.08.2005
Published in:
  • Nuclear Instruments and Methods in Physics Research B: Beam Interactions with Materials and Atoms. - 2005, vol. 238, p. 353
English High-resolution measurements of the resonant X-ray Raman scattering (RRS) of Al and Si and their oxides were performed at the European Synchrotron Radiation Facility (ESRF) in Grenoble, France, using a von Hamos Bragg-type curved crystal spectrometer. To probe the influence of chemical effects on the RRS X-ray spectra, Al₂O₃ and SiO₂ samples were also investigated. The X-ray RRS spectra... Show more…
Faculty
Faculté des sciences et de médecine
Department
Département de Physique
Language
  • English
Classification
Physics
License
License undefined
Identifiers
Persistent URL
https://folia.unifr.ch/unifr/documents/299989