Resonant X-ray Raman scattering for Al, Si and their oxides
- Szlachetko, Jakub Department of Physics, University of Fribourg, Switzerland
- Berset, Michel Department of Physics, University of Fribourg, Switzerland
- Dousse, Jean-Claude Department of Physics, University of Fribourg, Switzerland
- Fennane, Karima Department of Physics, University of Fribourg, Switzerland
- Szlachetko, Monika Department of Physics, University of Fribourg, Switzerland
- Barrett, R. European Synchrotron Radiation Facility, Grenoble, France
- Hoszowska, Joanna European Synchrotron Radiation Facility, Grenoble, France
- Kubala-Kukus, A. Swietokrzyska Academy, Institute of Physics, Kielce, Poland
- Pajek, M. Swietokrzyska Academy, Institute of Physics, Kielce, Poland
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01.08.2005
Published in:
- Nuclear Instruments and Methods in Physics Research B: Beam Interactions with Materials and Atoms. - 2005, vol. 238, p. 353
English
High-resolution measurements of the resonant X-ray Raman scattering (RRS) of Al and Si and their oxides were performed at the European Synchrotron Radiation Facility (ESRF) in Grenoble, France, using a von Hamos Bragg-type curved crystal spectrometer. To probe the influence of chemical effects on the RRS X-ray spectra, Al₂O₃ and SiO₂ samples were also investigated. The X-ray RRS spectra were measured at different photon beam energies tuned below the K-absorption edge. The measured spectra are compared to results of RRS calculations based on the second- order perturbation theory within the Kramers–Heisenberg approach.
- Faculty
- Faculté des sciences et de médecine
- Department
- Département de Physique
- Language
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- English
- Classification
- Physics
- License
- License undefined
- Identifiers
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- RERO DOC 5468
- DOI 10.1016/j.nimb.2005.06.075
- Persistent URL
- https://folia.unifr.ch/unifr/documents/299989
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