Resonant X-ray Raman scattering for Al, Si and their oxides
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Szlachetko, Jakub
Department of Physics, University of Fribourg, Switzerland
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Berset, Michel
Department of Physics, University of Fribourg, Switzerland
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Dousse, Jean-Claude
Department of Physics, University of Fribourg, Switzerland
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Fennane, Karima
Department of Physics, University of Fribourg, Switzerland
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Szlachetko, Monika
Department of Physics, University of Fribourg, Switzerland
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Barrett, R.
European Synchrotron Radiation Facility, Grenoble, France
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Hoszowska, Joanna
European Synchrotron Radiation Facility, Grenoble, France
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Kubala-Kukus, A.
Swietokrzyska Academy, Institute of Physics, Kielce, Poland
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Pajek, M.
Swietokrzyska Academy, Institute of Physics, Kielce, Poland
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Published in:
- Nuclear Instruments and Methods in Physics Research B: Beam Interactions with Materials and Atoms. - 2005, vol. 238, p. 353
English
High-resolution measurements of the resonant X-ray Raman scattering (RRS) of Al and Si and their oxides were performed at the European Synchrotron Radiation Facility (ESRF) in Grenoble, France, using a von Hamos Bragg-type curved crystal spectrometer. To probe the influence of chemical effects on the RRS X-ray spectra, Al₂O₃ and SiO₂ samples were also investigated. The X-ray RRS spectra were measured at different photon beam energies tuned below the K-absorption edge. The measured spectra are compared to results of RRS calculations based on the second- order perturbation theory within the Kramers–Heisenberg approach.
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Faculty
- Faculté des sciences et de médecine
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Department
- Département de Physique
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Language
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Classification
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Physics
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License
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License undefined
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Identifiers
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Persistent URL
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https://folia.unifr.ch/unifr/documents/299989
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