Field emission of individual carbon nanotubes in the scanning electron microscope.

Bonard JM; Dean KA; Coll BF; Klinke C

doi:10.1103/PhysRevLett.89.197602

Back

Journal article

Field emission of individual carbon nanotubes in the scanning electron microscope.

Bonard JM Institut de Physique des Nanostructures, Faculté des Sciences de Base, Ecole Polytechnique Fédérale de Lausanne, CH-1015 Lausanne EPFL, Switzerland. jean-marc.bonard@a3.epfl.ch
Dean KA
Coll BF
Klinke C

2002-11-22

Published in:

Physical review letters. - 2002

English The field emission of individual multiwall carbon nanotubes grown by chemical vapor deposition was measured in a scanning electron microscope. By using a sharp anode, we were able to select one nanotube for measurements in carefully controlled conditions. Single nanotubes follow the Fowler-Nordheim law, and the dependence of the field enhancement with interelectrode distance and nanotube radius is in good agreement with the recent model of Edgcombe and Valdré. Our results suggest that only nanotubes with the highest field enhancement factors, i.e., at least 8x higher than those of the average nanotube population, contribute to the emitted current in usual large area measurements.

Language

English

Open access status

green

Identifiers

DOI 10.1103/PhysRevLett.89.197602
PMID 12443148

Persistent URL

https://folia.unifr.ch/global/documents/83883

Statistics

Document views: 45 File downloads:

Full-text: 0