Journal article
Quantitative thermometry of nanoscale hot spots.
- Menges F IBM Research - Zurich, Säumerstrasse 4, CH-8803 Rüschlikon, Switzerland. fam@zurich.ibm.com
- Riel H
- Stemmer A
- Gotsmann B
- 2012-01-05
Published in:
- Nano letters. - 2012
Microscopy, Electron, Scanning
Nanowires
Silicon
Surface Properties
Temperature
Thermal Conductivity
English
A method is described to quantify thermal conductance and temperature distributions with nanoscale resolution using scanning thermal microscopy. In the first step, the thermal resistance of the tip-surface contact is measured for each point of a surface. In the second step, the local temperature is determined from the difference between the measured heat flux for heat sources switched on and off. The method is demonstrated using self-heating of silicon nanowires. While a homogeneous nanowire shows a bell-shaped temperature profile, a nanowire diode exhibits a hot spot centered near the junction between two doped segments.
- Language
-
- English
- Open access status
- closed
- Identifiers
-
- DOI 10.1021/nl203169t
- PMID 22214277
- Persistent URL
- https://folia.unifr.ch/global/documents/66523
Statistics
Document views: 10
File downloads: