Thermal Conductivity of Monolayer Molybdenum Disulfide Obtained from Temperature-Dependent Raman Spectroscopy
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Yan, Rusen
Department of Electrical Engineering, University of Notre Dame, Notre Dame, Indiana 46556, United States
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Simpson, Jeffrey R.
Department of Physics, Astronomy, and Geosciences, Towson University, Towson, Maryland 21252, United States
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Bertolazzi, Simone
Electrical Engineering Institute, Ecole Polytechnique Federale de Lausanne (EPFL), CH-1015 Lausanne, Switzerland
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Brivio, Jacopo
Electrical Engineering Institute, Ecole Polytechnique Federale de Lausanne (EPFL), CH-1015 Lausanne, Switzerland
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Watson, Michael
Department of Physics, Astronomy, and Geosciences, Towson University, Towson, Maryland 21252, United States
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Wu, Xufei
Department of Aerospace and Mechanical Engineering, University of Notre Dame, Notre Dame, Indiana 46556, United States
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Kis, Andras
Electrical Engineering Institute, Ecole Polytechnique Federale de Lausanne (EPFL), CH-1015 Lausanne, Switzerland
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Luo, Tengfei
Department of Aerospace and Mechanical Engineering, University of Notre Dame, Notre Dame, Indiana 46556, United States
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Hight Walker, Angela R.
Semiconductor and Dimensional Metrology Division, National Institute of Standards and Technology (NIST), Gaithersburg, Maryland 20899, United States
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Xing, Huili Grace
Department of Electrical Engineering, University of Notre Dame, Notre Dame, Indiana 46556, United States
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Published in:
- ACS Nano. - American Chemical Society (ACS). - 2014, vol. 8, no. 1, p. 986-993
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Language
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Open access status
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green
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Persistent URL
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https://folia.unifr.ch/global/documents/256097
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