Radio-Frequency Characteristics of Ge-Doped Vanadium Dioxide Thin Films with Increased Transition Temperature

Muller, Andrei; Khadar, Riyaz A.; Abel, Tobias; Negm, Nour; Rosca, Teodor; Krammer, Anna; Cavalieri, Matteo; Schueler, Andreas; Qaderi, Fatemeh; Bolten, Jens; Lemme, Max; Stolichnov, Igor; Ionescu, Adrian M.

doi:10.1021/acsaelm.0c00078

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Journal article

Radio-Frequency Characteristics of Ge-Doped Vanadium Dioxide Thin Films with Increased Transition Temperature

Muller, Andrei ORCID Nanoelectronic Devices Laboratory (NanoLab), École Polytechnique Fédérale de Lausanne (EPFL), 1015 Lausanne, Switzerland
Khadar, Riyaz A. Powerlab, École Polytechnique Fédérale de Lausanne (EPFL), 1015 Lausanne, Switzerland
Abel, Tobias Chair of Electronic Devices, RWTH Aachen University, 52062 Aachen, Germany
Negm, Nour Chair of Electronic Devices, RWTH Aachen University, 52062 Aachen, Germany
Rosca, Teodor Nanoelectronic Devices Laboratory (NanoLab), École Polytechnique Fédérale de Lausanne (EPFL), 1015 Lausanne, Switzerland
Krammer, Anna Solar Energy and Building Physics Laboratory (LESO-PB), École Polytechnique Fédérale de Lausanne (EPFL), 1015, Lausanne, Switzerland
Cavalieri, Matteo ORCID Nanoelectronic Devices Laboratory (NanoLab), École Polytechnique Fédérale de Lausanne (EPFL), 1015 Lausanne, Switzerland
Schueler, Andreas Solar Energy and Building Physics Laboratory (LESO-PB), École Polytechnique Fédérale de Lausanne (EPFL), 1015, Lausanne, Switzerland
Qaderi, Fatemeh Nanoelectronic Devices Laboratory (NanoLab), École Polytechnique Fédérale de Lausanne (EPFL), 1015 Lausanne, Switzerland
Bolten, Jens AMO GmbH, Otto-Blumenthal-Str. 25, 52074 Aachen, Germany
Lemme, Max ORCID Chair of Electronic Devices, RWTH Aachen University, 52062 Aachen, Germany
Stolichnov, Igor ORCID Nanoelectronic Devices Laboratory (NanoLab), École Polytechnique Fédérale de Lausanne (EPFL), 1015 Lausanne, Switzerland
Ionescu, Adrian M. Nanoelectronic Devices Laboratory (NanoLab), École Polytechnique Fédérale de Lausanne (EPFL), 1015 Lausanne, Switzerland

2020-4-16

Published in:

ACS Applied Electronic Materials. - American Chemical Society (ACS). - 2020, vol. 2, no. 5, p. 1263-1272

Language

English

Open access status

closed

Identifiers

DOI 10.1021/acsaelm.0c00078
ISSN 2637-6113

Persistent URL

https://folia.unifr.ch/global/documents/230752

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