25th Anniversary of STED Microscopy and the 20th Anniversary of SIM: feature introduction.
- Kner P School of Electrical and Computer Engineering, University of Georgia, Athens, GA 30602, USA.
- Manley S Institute of Physics, Swiss Federal Institute of Technology Lausanne (EPFL), 1015 Lausanne, Switzerland.
- Shechtman Y Biomedical Engineering Department, Technion, 32000 Haifa, Israel.
- Stallinga S Quantitative Imaging Group, Delft University of Technology, Delft, Netherlands.
- 2020-03-25
Published in:
- Biomedical optics express. - 2020
English
This feature issue commemorating 25 years of STED microscopy and 20 years of SIM is intended to highlight the incredible progress and growth in the field of superresolution microscopy since Stefan Hell and Jan Wichmann published the article Breaking the diffraction resolution limit by stimulated emission: stimulated-emission-depletion fluorescence microscopy in Optics Letters in 1994.
- Language
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- English
- Open access status
- green
- Identifiers
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- DOI 10.1364/BOE.391490
- PMID 32206437
- Persistent URL
- https://folia.unifr.ch/global/documents/212595
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