Spatially resolved Raman spectroscopy of single- and few-layer graphene.
- Graf D Solid State Physics Laboratory, ETH Zurich, 8093 Zurich, Switzerland. grafdavy@phys.ethz.ch
- Molitor F
- Ensslin K
- Stampfer C
- Jungen A
- Hierold C
- Wirtz L
- 2007-02-15
Published in:
- Nano letters. - 2007
English
We present Raman spectroscopy measurements on single- and few-layer graphene flakes. By using a scanning confocal approach, we collect spectral data with spatial resolution, which allows us to directly compare Raman images with scanning force micrographs. Single-layer graphene can be distinguished from double- and few-layer by the width of the D' line: the single peak for single-layer graphene splits into different peaks for the double-layer. These findings are explained using the double-resonant Raman model based on ab initio calculations of the electronic structure and of the phonon dispersion. We investigate the D line intensity and find no defects within the flake. A finite D line response originating from the edges can be attributed either to defects or to the breakdown of translational symmetry.
- Language
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- English
- Open access status
- green
- Identifiers
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- DOI 10.1021/nl061702a
- PMID 17297984
- Persistent URL
- https://folia.unifr.ch/global/documents/136390
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