<oai_dc:dc xmlns:dc="http://purl.org/dc/elements/1.1/" xmlns:oai_dc="http://www.openarchives.org/OAI/2.0/oai_dc/" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xsi:schemaLocation="http://www.openarchives.org/OAI/2.0/oai_dc/ http://www.openarchives.org/OAI/2.0/oai_dc.xsd">
  <dc:creator>Jaouen, Thomas</dc:creator>
  <dc:creator>Tricot, S.</dc:creator>
  <dc:creator>Delhaye, G.</dc:creator>
  <dc:creator>Lépine, B.</dc:creator>
  <dc:creator>Sébilleau, D.</dc:creator>
  <dc:creator>Jézéquel, G.</dc:creator>
  <dc:creator>Schieffer, Philippe</dc:creator>
  <dc:date>2013-07-11</dc:date>
  <dc:description xmlns:ns0="xml" ns0:lang="en">By combining x-ray excited Auger electron diffraction experiments and multiple scattering calculations we reveal a layer-resolved shift for the Mg KL₂₃L₂₃ Auger transition in MgO ultrathin films (4–6 Å) on Ag(001). This resolution is exploited to demonstrate the possibility of controlling Mg atom incorporation at the MgO/Ag(001) interface by exposing the MgO films to a Mg flux. A substantial reduction of the MgO/Ag(001) work function is observed during the exposition phase and reflects both band-offset variations at the interface and band bending effects in the oxide film.</dc:description>
  <dc:format>application/pdf</dc:format>
  <dc:identifier>https://folia.unifr.ch/global/documents/303169</dc:identifier>
  <dc:identifier>https://folia.unifr.ch/documents/303169/files/jao_lrs.pdf</dc:identifier>
  <dc:language>eng</dc:language>
  <dc:relation>info:eu-repo/semantics/altIdentifier/doi/10.1103/PhysRevLett.111.027601</dc:relation>
  <dc:rights>info:eu-repo/semantics/openAccess</dc:rights>
  <dc:rights>License undefined</dc:rights>
  <dc:source>Physical Review Letters. - 2013, vol. 111, no. 2, p. 027601</dc:source>
  <dc:subject>info:eu-repo/classification/udc/53</dc:subject>
  <dc:title xmlns:ns1="xml" ns1:lang="en">Layer-resolved study of Mg atom incorporation at the MgO/Ag(001) buried interface</dc:title>
  <dc:type>http://purl.org/coar/resource_type/c_6501</dc:type>
</oai_dc:dc>