Szlachetko, Jakub Nachtegaal, M. Boni, E. de Willimann, M. Safonova, O. Sa, J. Smolentsev, G. Szlachetko, Monika Bokhoven, J. A. van Dousse, Jean-Claude Hoszowska, Joanna Kayser, Yves Jagodziński, P. Bergamaschi, A. Schmitt, Bernd David, Christian Lücke, A. 2012-10-09 We report on the design and performance of a wavelength-dispersive type spectrometer based on the von Hamos geometry. The spectrometer is equipped with a segmented-type crystal for x-ray diffraction and provides an energy resolution in the order of 0.25 eV and 1 eV over an energy range of 8000 eV–9600 eV. The use of a segmented crystal results in a simple and straightforward crystal preparation that allows to preserve the spectrometer resolution and spectrometer efficiency. Application of the spectrometer for time-resolved resonant inelastic x-ray scattering and single-shot x-ray emission spectroscopy is demonstrated. application/pdf https://folia.unifr.ch/global/documents/302755 https://folia.unifr.ch/documents/302755/files/dou_hxs.pdf eng info:eu-repo/semantics/altIdentifier/doi/10.1063/1.4756691 info:eu-repo/semantics/openAccess License undefined Review of Scientific Instruments. - 2012, vol. 83, no. 10, p. 103105 info:eu-repo/classification/udc/53 A von Hamos x-ray spectrometer based on a segmented-type diffraction crystal for single-shot x-ray emission spectroscopy and time-resolved resonant inelastic x-ray scattering studies http://purl.org/coar/resource_type/c_6501