Despont, L. Naumović, Dusanka Clerc, F. Koitzsch, C. Garnier, Michael G. Abajo, F. J. Garcia de Hove, M. A. Van 2005-12-05 Multiple scattering theory based on a cluster model is used to simulate full-hemispherical X-ray photoelectron diffraction measurements in order to verify how state of the art multiple scattering simulations are able to reproduce the experiment. This approach is applied to the Cu(1 1 1) surface for two different photoelectron kinetic energies. Differences and similarities between single and multiple scattering are discussed in comparison with experimental results. We find that the present approach gives very good results despite some limitations. application/pdf https://folia.unifr.ch/global/documents/300166 https://folia.unifr.ch/documents/300166/files/naumovic_xrp.pdf eng info:eu-repo/semantics/altIdentifier/doi/10.1016/j.susc.2005.10.038 info:eu-repo/semantics/openAccess License undefined Surface Science. - 2006, vol. 600, no. 2, p. 380-385 Photoelectron diffraction multiple scattering Copper electron solid interaction scattering diffraction info:eu-repo/classification/udc/53 X-ray photoelectron diffraction study of Cu(1 1 1): Multiple scattering investigation http://purl.org/coar/resource_type/c_6501