Szlachetko, Jakub Berset, Michel Dousse, Jean-Claude Fennane, Karima Szlachetko, Monika Barrett, R. Hoszowska, Joanna Kubala-Kukus, A. Pajek, M. 2005-08-01 High-resolution measurements of the resonant X-ray Raman scattering (RRS) of Al and Si and their oxides were performed at the European Synchrotron Radiation Facility (ESRF) in Grenoble, France, using a von Hamos Bragg-type curved crystal spectrometer. To probe the influence of chemical effects on the RRS X-ray spectra, Al₂O₃ and SiO₂ samples were also investigated. The X-ray RRS spectra were measured at different photon beam energies tuned below the K-absorption edge. The measured spectra are compared to results of RRS calculations based on the second- order perturbation theory within the Kramers–Heisenberg approach. application/pdf https://folia.unifr.ch/global/documents/299989 https://folia.unifr.ch/documents/299989/files/1_dousse_rxr.pdf eng info:eu-repo/semantics/altIdentifier/doi/10.1016/j.nimb.2005.06.075 info:eu-repo/semantics/openAccess License undefined Nuclear Instruments and Methods in Physics Research B: Beam Interactions with Materials and Atoms. - 2005, vol. 238, p. 353 X-ray RRS TXRF High-resolution XES Second order perturbation theory info:eu-repo/classification/udc/53 Resonant X-ray Raman scattering for Al, Si and their oxides http://purl.org/coar/resource_type/c_6501